Latin American Test Symposium (LATS)

The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 16th LATS will be invited to re-submit to the IEEE Design and Test of Computers, IEEE Transactions on Computer-Aided Design, Journal of Electronic Testing: Theory and Applications - JETTA (Springer) and Journal of Low Power Electronics - JOLPE (American Scientific Publishers).

LATS 2015

LATS 2015 will take place in Puerto Vallarta, Mexico on March 25–27, 2015.

General Chairs:

Victor Champac – INAOE, Mexico. Yervant Zorian – SYNOPSYS, USA.

Program Chairs:

Leticia Bolzani Poehls – PUCRS, Brazil. Vishwani Agrawal – Auburn University, USA.

Official website: http://www-elec.inaoep.mx/~lats2015/index.php

Symposiums

Editions of Latin-American Test Symposium (previously Latin-American Test Workshop):

Conference

Date

Place

LATW 2000

March 13–15, 2000

Rio de Janeiro, Brazil

LATW 2001

February 11–14, 2001

Cancun, Mexico

LATW 2002

February 10–13, 2002

Montevideo, Uruguay

LATW 2003

February 16–19, 2003

Natal, Brazil

LATW 2004

February 22–25, 2004

Cartagena, Colombia

LATW 2005

March 30 - April 1, 2005

Salvador, Bahia, Brazil

LATW 2006

March 26–29, 2006

Buenos Aires, Argentina

LATW 2007

March 11–14, 2007

Cuzco, Peru

LATW 2008

February 17–20, 2008

Puebla, Mexico

LATW 2009

March 2–5, 2009

Buzios, Rio de Janeiro, Brazil

LATW 2010

March 28–31, 2010

Punta del Este, Uruguay

LATW 2011

March 27–30, 2011

Porto de Galinhas, Brazil

LATW 2012

April 10–13, 2012

Quito - Ecuador

LATW 2013

April 3–5, 2013

Cordoba, Argentina

LATW 2014

March 12–15, 2014

Fortaleza, Brazil